Conference Chairman
Riccardo Mariani,
Intel Fellow,
Functional Safety,
Intel Corporation

As part of Automotive IQ’s Safety and Security Series, this conference will tackle safety challenges of the semiconductor by

  •  Sharing the latest updates on ISO/DIS 26262:11 for competitive edge in functional safety
  •  Discussing improvements of the semiconductor usage in safety-critical systems for higher integrity level
  •  Discovering innovations in highly automated driving that the semiconductor sector can benefit from
  •  Addressing confidence issues in the use of software tools specifically designed for semiconductors challenges
  •  Analysing fault injection tools to support safety analysis
  •  Finding diverse approaches to handle the safety of multicore

Download Agenda

Featured Speakers

View All Speakers

Featured case studies:

Failure Mode Distribution – A frequently discussed topic without a standard solution

The ISO 26262 does not provide a best practice for distributing failure modes, especially when talking about semiconductors. Therefore, a detailed analysis of all safety-related blocks upon their failure modes shall be performed as a preparative step for an FMEDA. - SGS TÜV

Safety of Deep Neural Networks (DNN) for Autonomous Driving

DNNs are being widely used in autonomous driving but are often not as well understood as traditional rules based approaches.- NVIDIA

Challenges related to autonomous driving and how ISO 26262 (and its new part 11) can help

Autonomous driving is a reality with several automation levels being addressed today. However, ISO26262, even in its 2nd edition, has constraints to respect and cannot always help. - Renesas Electronics Europe

Sponsors & Exhibitors
Media Partners