04 - 07 December, 2018
Germany

Conference day 1

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Riccardo Mariani

Chief Functional Safety Technologist
Intel

8:00 am - 8:20 am Registration and welcome coffee

The ISO 26262 standard for functional safety in automotive E/E systems so far did not provide clear instructions for semiconductor companies. The freshly added part 11 is dedicated only to the semiconductor industry and aims d closing big gaps. Due to its novelty, part 11 offers quiet a lot of discussion potential on how to interpret and apply it. This panel will address the most important issues.
• The great achievement – Learn to read ISO 26262 part 11
• Application challenges and how to best overcome them
• FMEDA and FTA – Should they stay or should they go now?
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Riccardo Mariani

Chief Functional Safety Technologist
Intel

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Samir Camdzik

Systems Engineer
Texas Instruments

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Chanthachith Souvanthong

Corporate Functional Safety Manager
ON Semiconductor

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Yves Renard

Automotive BU Functional Safety Manager
ON Semiconductor, Belgium

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Riccardo Vincelli

Director of the Functional Safety Competence Center
Renesas Electronics Europe GmbH

9:40 am - 10:20 am Match & Win

Networking session

10:10 am - 10:40 am Coffee break

10:40 am - 11:20 am Scene Setting | From Semiconductor Components to ISO 26262 Compliant Functionally Safe Systems

Samir Camdzik - Systems Engineer, Texas Instruments
Bharat Rajaram - Director of Functional Safety, Texas Instruments
This presentation will begin by describing how to apply the ISO 26262-11:2018 standard for both semiconductor components developed as part of a compliant item as well as an SEooC. The presenters will then discuss
• How (during Functional Safety Analysis), the semiconductor component is divided into parts, subparts and elementary subparts
• What (and why), is the necessary and sufficient analysis technique?
• HW failure modes and how they relate to both HW faults and errors
• Failure modes, fault models and techniques to distribute base fail rates will be outlined
A case study that tackles mixed-signal fault injection and failure mode distributions will be presented. Finally, a method to leverage component safety analysis to the design and production of functionally safe systems is described.
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Samir Camdzik

Systems Engineer
Texas Instruments

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Bharat Rajaram

Director of Functional Safety
Texas Instruments

Diagnostic coverage is a key metric to achieve target ASILs for safety-critical systems. This
session describes a case study and best practices to determine the required diagnostic coverage
during a fault injection campaign in an IP core. We will detail the methodology and fault injection
flow, including:
• Steps in a fault campaign flow- Input data required for fault injection
• Analysis of the output data for convergence- Issues, challenges, and recommendations
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Shivakumar Chonnad

Senior Staff Engineer - IP Quality and Functional Safety
Synopsys

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Shrenik Metha

Program Management Director
Synopsys

12:00 pm - 12:40 pm Application Specific Safeness Analysis for Semiconductors

Balaji Venu - Staff Research Engineer, ARM
Reliability estimation is critical for the safety analysis of cyber-physical systems (e.g. Automotive). With increasing system complexity, meeting functional safety requirements using existing methods is a challenge. This presentation will describe
• An analytical methodology for reliability estimation
• Show results of a practical example on the microarchitecture for Arm CPUs
• This application-specific, fine-grained methodology will enable a reliability aware design process that helps meet functional safety requirements by promoting collaboration between OEMs, Tier1s and Silicon Partners.
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Balaji Venu

Staff Research Engineer
ARM

12:40 pm - 1:40 pm Network luncheon

1:40 pm - 2:20 pm ISO-26262 for ASIC engineers, introduction

Jamil Mazzawi - Founder and CEO - Functional Safety, Optima Design Automation
In this presentation we give an introduction for ISO-26262 requirements from semiconductor and IP vendors. The presentation is in the language of the average ASIC design and verification engineers. Then we discuss how Optima’s tools address these requirements.
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Jamil Mazzawi

Founder and CEO - Functional Safety
Optima Design Automation

2:20 pm - 3:00 pm A systematic extraction of failure modes for analogue cricuits

Renaud Gillon - Program Manager ON Semiconductor
A method is proposed allowing to automatically identify the failure modes of an analogue circuit based on fault-injection simulations. Based on the similarity of the induced faulty behaviors, a clustering is realized and one fault per group is elected as representative of the failure mode.
Modal fault models are then extracted using the wrapper approach.
• Analogue circuits
• Fault-grouping
• Abstract fault models
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Renaud Gillon

Program Manager
ON Semiconductor

3:00 pm - 3:40 pm Challenges and opportunities for automotive semiconductor design and verification methodologies

Alessandra Nardi - Software Engineering Group Director, Cadence Design Systems, USA
Art Schaldenbrand - Senior Product Manager, Cadence Design Systems
As automotive applications grow in complexity and size, the challenges to support the development of safety critical components are increasing and so are the opportunities. There is a significant need for new design and verification methodologies to fulfill automotive requirements as an integral part of the EDA (Electronic Design Automation) flow for digital, analog, and mixed-signal semiconductors.
• FMEDA meets EDA
• Opportunities for safety optimization
• Challenges of consistency and standardization
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Alessandra Nardi

Software Engineering Group Director
Cadence Design Systems, USA

Art Schaldenbrand

Senior Product Manager
Cadence Design Systems

3:40 pm - 4:10 pm Refreshment break and networking

This panel discussion serves as an exchange of ideas between semiconductor companies, Tier 1 and OEM in order to discuss challenges and successes in their corporation. Ideas of improvement will be discussed and different views on the inter-work will be given.
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Bharat Rajaram

Director of Functional Safety
Texas Instruments

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Dr. Rafael Zalman

Senior Principal Functional Safety Development
Infineon Technologies AG

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Dr. Christian Kehl

Automotive Electronics, Engineering Sensors Inertial: Acceleration
Robert Bosch GmbH

Panos Gnafakis

Lead Embedded Software Design SME - Advanced Electronics
Jaguar Land Rover

Power Management Integrated Circuits (PMIC) manage the power requirements of the host system. The PMIC market faces strong trends towards a growing demand for energy-efficient battery-powered devices, as well as increased sales in the automotive sector. This presentation
will cover the main functional safety aspects of PMIC.
• Interaction between Safety PMIC and Safety MCU
• Safety vs. availability
• Fail Silent vs. Fail Operational
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Ole-Kristian Skroppa

Senior Staff Application Engineer Safety System Power Supplies
Infineon Technologies AG, Germany

5:30 pm - 5:40 pm Closing remarks by chairman

Riccardo Mariani - Chief Functional Safety Technologist, Intel
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Riccardo Mariani

Chief Functional Safety Technologist
Intel

6:00 pm - 8:00 pm Evening event