04 - 07 December, 2018

Balaji Venu

Staff Research Engineer

12:00 PM Application Specific Safeness Analysis for Semiconductors

Reliability estimation is critical for the safety analysis of cyber-physical systems (e.g. Automotive). With increasing system complexity, meeting functional safety requirements using existing methods is a challenge. This presentation will describe
• An analytical methodology for reliability estimation
• Show results of a practical example on the microarchitecture for Arm CPUs
• This application-specific, fine-grained methodology will enable a reliability aware design process that helps meet functional safety requirements by promoting collaboration between OEMs, Tier1s and Silicon Partners.

Check out the incredible speaker line-up to see who will be joining Antonio.

Download The Latest Agenda