A method is proposed allowing to automatically identify the failure modes of an analogue circuit based on fault-injection simulations. Based on the similarity of the induced faulty behaviors, a clustering is realized and one fault per group is elected as representative of the failure mode.
Modal fault models are then extracted using the wrapper approach.
• Analogue circuits
• Abstract fault models
Selected project partners will present how AutoDrive strives to advance methodologies to develop fail-aware,fail-safe, and fail-operational electronic components, systems, and architectures for fully automated driving.