04 - 07 December, 2018

Renaud Gillon

Program Manager
ON Semiconductor

2:20 PM A systematic extraction of failure modes for analogue cricuits

A method is proposed allowing to automatically identify the failure modes of an analogue circuit based on fault-injection simulations. Based on the similarity of the induced faulty behaviors, a clustering is realized and one fault per group is elected as representative of the failure mode.
Modal fault models are then extracted using the wrapper approach.
• Analogue circuits
• Fault-grouping
• Abstract fault models

5:00 PM B - Advancing Functional Safety Methodologies in AutoDrive

Selected project partners will present how AutoDrive strives to advance methodologies to develop fail-aware,fail-safe, and fail-operational electronic components, systems, and architectures for fully automated driving.

Check out the incredible speaker line-up to see who will be joining Renaud.

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